@article{DBLP:journals/mr/TanCAC05,
author = {Shyue Seng Tan and
Tu Pei Chen and
Chew Hoe Ang and
Lap Chan},
title = {Mechanism of nitrogen-enhanced negative bias temperature
instability in pMOSFET},
journal = {Microelectronics Reliability},
volume = {45},
number = {1},
year = {2005},
pages = {19-30},
ee = {http://dx.doi.org/10.1016/j.microrel.2004.02.015},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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