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BibTeX record journals/mr/TakedaMTOEHK02
@article{DBLP:journals/mr/TakedaMTOEHK02, author = {Eiji Takeda and Eiichi Murakami and Kazuyoshi Torii and Yutaka Okuyama and Eishi Ebe and Kenji Hinode and Shin'ichiro Kimura}, title = {Reliability issues of silicon LSIs facing 100-nm technology node}, journal = {Microelectron. Reliab.}, volume = {42}, number = {4-5}, pages = {493--506}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00029-X}, doi = {10.1016/S0026-2714(02)00029-X}, timestamp = {Sat, 22 Feb 2020 19:28:13 +0100}, biburl = {https://dblp.org/rec/journals/mr/TakedaMTOEHK02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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