BibTeX record journals/mr/SzelochGJ02

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@article{DBLP:journals/mr/SzelochGJ02,
  author       = {R. F. Szeloch and
                  Teodor P. Gotszalk and
                  Pawel Janus},
  title        = {Scanning Thermal Microscopy in Microsystem Reliability Analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1719--1722},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00219-6},
  doi          = {10.1016/S0026-2714(02)00219-6},
  timestamp    = {Sat, 22 Feb 2020 19:28:14 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SzelochGJ02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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