BibTeX record journals/mr/SydloMGHKDCCFB01

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@article{DBLP:journals/mr/SydloMGHKDCCFB01,
  author       = {Cezary Sydlo and
                  Bastian Mottet and
                  Husin Ganis and
                  Hans L. Hartnagel and
                  Viktor Krozer and
                  Sylvain L. Delage and
                  Simone Cassette and
                  Eric Chartier and
                  D. Floriot and
                  Steven Bland},
  title        = {Defect detection and modelling using pulsed electrical stress for
                  reliability investigations of InGaP {HBT}},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {9-10},
  pages        = {1567--1571},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00184-6},
  doi          = {10.1016/S0026-2714(01)00184-6},
  timestamp    = {Fri, 27 Mar 2020 08:44:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SydloMGHKDCCFB01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}