BibTeX record journals/mr/Stojcev03d

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@article{DBLP:journals/mr/Stojcev03d,
  author       = {Mile K. Stojcev},
  title        = {High Performance Memory Testing: Design Principles, Fault Modeling
                  and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston,
                  2003, Hardcover, pp 247, plus XIII, {ISBN} 1-4020-7255-4},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {5},
  pages        = {819},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00056-8},
  doi          = {10.1016/S0026-2714(03)00056-8},
  timestamp    = {Sat, 22 Feb 2020 19:29:06 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Stojcev03d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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