BibTeX record: journals/mr/StojadinovicMDDGD02

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@article{DBLP:journals/mr/StojadinovicMDDGD02,
  author    = {Ninoslav Stojadinovic and
               Ivica Manic and
               Snezana Djoric{-}Veljkovic and
               Vojkan Davidovic and
               Snezana Golubovic and
               Sima Dimitrijev},
  title     = {Effects of high electric field and elevated-temperature bias stressing
               on radiation response in power VDMOSFETs},
  journal   = {Microelectronics Reliability},
  year      = {2002},
  volume    = {42},
  number    = {4-5},
  pages     = {669--677},
  url       = {http://dx.doi.org/10.1016/S0026-2714(02)00039-2},
  doi       = {10.1016/S0026-2714(02)00039-2},
  timestamp = {Wed, 17 Sep 2014 19:54:53 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/StojadinovicMDDGD02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}