BibTeX record journals/mr/StadlerBGG09

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@article{DBLP:journals/mr/StadlerBGG09,
  author       = {Wolfgang Stadler and
                  Tilo Brodbeck and
                  Reinhold G{\"{a}}rtner and
                  Harald Gossner},
  title        = {Do {ESD} fails in systems correlate with {IC} {ESD} robustness?},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1079--1085},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.029},
  doi          = {10.1016/J.MICROREL.2009.07.029},
  timestamp    = {Thu, 14 Oct 2021 09:38:46 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/StadlerBGG09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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