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DBLP BibTeX Record 'journals/mr/StadlerBGG09'

@article{DBLP:journals/mr/StadlerBGG09,
  author    = {Wolfgang Stadler and
               Tilo Brodbeck and
               Reinhold G{\"a}rtner and
               Harald Gossner},
  title     = {Do ESD fails in systems correlate with IC ESD robustness?},
  journal   = {Microelectronics Reliability},
  volume    = {49},
  number    = {9-11},
  year      = {2009},
  pages     = {1079-1085},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2009.07.029},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}