BibTeX record journals/mr/SoussanLDCB03

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@article{DBLP:journals/mr/SoussanLDCB03,
  author       = {Philippe Soussan and
                  G. Lekens and
                  R. Dreesen and
                  Ward De Ceuninck and
                  Eric Beyne},
  title        = {Advantage of In-situ over Ex-situ techniques as reliability tool:
                  Aging kinetics of Imec's {MCM-D} discrete passives devices},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1785--1790},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00301-9},
  doi          = {10.1016/S0026-2714(03)00301-9},
  timestamp    = {Thu, 14 Oct 2021 09:38:47 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SoussanLDCB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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