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@article{DBLP:journals/mr/SorgeH01,
author = {Roland Sorge and
Bernd Heinemann},
title = {Recombination current measurements in the space charge region
of MOS field-induced pn junctions},
journal = {Microelectronics Reliability},
volume = {41},
number = {6},
year = {2001},
pages = {789-795},
ee = {http://dx.doi.org/10.1016/S0026-2714(01)00040-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-03-25 by Michael Ley (ley@uni-trier.de)