BibTeX record journals/mr/SluisESDG07

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@article{DBLP:journals/mr/SluisESDG07,
  author       = {Olaf van der Sluis and
                  R. A. B. Engelen and
                  Richard B. R. van Silfhout and
                  W. D. van Driel and
                  Marcel A. J. van Gils},
  title        = {Efficient damage sensitivity analysis of advanced Cu/low-k bond pad
                  structures by means of the area release energy criterion},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {12},
  pages        = {1975--1982},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.04.004},
  doi          = {10.1016/J.MICROREL.2007.04.004},
  timestamp    = {Sat, 30 Sep 2023 10:21:35 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SluisESDG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}