Sik-Lam Siu Hei Wong Wing-Shan Tam Kuniyuki Kakushima Hiroshi Iwai Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. 387-391 2009 49 Microelectronics Reliability 4 http://dx.doi.org/10.1016/j.microrel.2009.01.004 db/journals/mr/mr49.html#SiuWTKI09