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BibTeX record journals/mr/SchusterVS01
@article{DBLP:journals/mr/SchusterVS01, author = {Constance E. Schuster and Mark G. Vangel and Harry A. Schafft}, title = {Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions}, journal = {Microelectron. Reliab.}, volume = {41}, number = {2}, pages = {239--252}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(00)00227-4}, doi = {10.1016/S0026-2714(00)00227-4}, timestamp = {Sat, 22 Feb 2020 19:27:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchusterVS01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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