DBLP Record 'journals/mr/SchlunderBAGGT05'

BibTeX

@article{DBLP:journals/mr/SchlunderBAGGT05,
  author    = {Christian Schl{\"u}nder and
               Ralf Brederlow and
               Benno Ankele and
               Wolfgang Gustin and
               Karl Goser and
               Roland Thewes},
  title     = {Effects of inhomogeneous negative bias temperature stress
               on p-channel MOSFETs of analog and RF circuits},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {1},
  year      = {2005},
  pages     = {39-46},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2004.03.017},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}