BibTeX record journals/mr/RongenRWVSW14

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@article{DBLP:journals/mr/RongenRWVSW14,
  author       = {R. T. H. Rongen and
                  R. Roucou and
                  P. J. vd Wel and
                  F. C. Voogt and
                  F. Swartjes and
                  Kirsten Weide{-}Zaage},
  title        = {Reliability of Wafer Level Chip Scale Packages},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1988--1994},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.012},
  doi          = {10.1016/J.MICROREL.2014.07.012},
  timestamp    = {Sat, 22 Feb 2020 19:27:02 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RongenRWVSW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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