<?xml version="1.0"?>
<dblp>
<article key="journals/mr/RidoutDBH06" mdate="2007-03-27">
<author>Stephen Ridout</author>
<author>Milos Dusek</author>
<author>Chris Bailey</author>
<author>Chris Hunt</author>
<title>Assessing the performance of crack detection tests for solder joints.</title>
<pages>2122-2130</pages>
<year>2006</year>
<volume>46</volume>
<journal>Microelectronics Reliability</journal>
<number>12</number>
<ee>http://dx.doi.org/10.1016/j.microrel.2006.05.001</ee>
<url>db/journals/mr/mr46.html#RidoutDBH06</url>
</article>
</dblp>
