BibTeX record journals/mr/RheeL05

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@article{DBLP:journals/mr/RheeL05,
  author       = {Se Jong Rhee and
                  Jack C. Lee},
  title        = {Threshold voltage instability characteristics of HfO\({}_{\mbox{2}}\)
                  dielectrics n-MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {7-8},
  pages        = {1051--1060},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.01.006},
  doi          = {10.1016/J.MICROREL.2005.01.006},
  timestamp    = {Sat, 22 Feb 2020 19:27:50 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RheeL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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