BibTeX record journals/mr/RenH01

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@article{DBLP:journals/mr/RenH01,
  author       = {Hongxia Ren and
                  Yue Hao},
  title        = {Study on the degradation induced by donor interface state in deep-sub-micron
                  grooved-gate P-channel MOSFET's},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {4},
  pages        = {597--604},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00233-X},
  doi          = {10.1016/S0026-2714(00)00233-X},
  timestamp    = {Sat, 22 Feb 2020 19:28:30 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RenH01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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