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BibTeX record journals/mr/PuchnerLKDC01
@article{DBLP:journals/mr/PuchnerLKDC01, author = {Helmut Puchner and Y.{-}C. Liu and W. Kong and F. Duan and R. Castagnetti}, title = {Substrate Engineering to Improve Soft-Error-Rate Immunity for {SRAM} Technologies}, journal = {Microelectron. Reliab.}, volume = {41}, number = {9-10}, pages = {1319--1324}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00207-4}, doi = {10.1016/S0026-2714(01)00207-4}, timestamp = {Sat, 22 Feb 2020 19:28:26 +0100}, biburl = {https://dblp.org/rec/journals/mr/PuchnerLKDC01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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