BibTeX record journals/mr/PostLBHSSWOLD05

download as .bib file

@article{DBLP:journals/mr/PostLBHSSWOLD05,
  author       = {H. A. Post and
                  P. Letullier and
                  T. Briolat and
                  R. Humke and
                  R. Schuhmann and
                  K. Saarinen and
                  W. Werner and
                  Yves Ousten and
                  G. Lekens and
                  A. Dehbi},
  title        = {Failure mechanisms and qualification testing of passive components},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1626--1632},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.085},
  doi          = {10.1016/J.MICROREL.2005.07.085},
  timestamp    = {Sat, 22 Feb 2020 19:28:58 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PostLBHSSWOLD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.