DBLP BibTeX Record 'journals/mr/PomplKRK06'

@article{DBLP:journals/mr/PomplKRK06,
  author    = {T. Pompl and
               A. Kerber and
               M. R{\"o}hner and
               M. Kerber},
  title     = {Gate voltage and oxide thickness dependence of progressive
               wear-out of ultra-thin gate oxides},
  journal   = {Microelectronics Reliability},
  volume    = {46},
  number    = {9-11},
  year      = {2006},
  pages     = {1603-1607},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2006.07.042},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}