BibTeX record: journals/mr/PomplKRK06

download as .bib file

@article{DBLP:journals/mr/PomplKRK06,
  author    = {T. Pompl and
               A. Kerber and
               M. R{\"{o}}hner and
               M. Kerber},
  title     = {Gate voltage and oxide thickness dependence of progressive wear-out
               of ultra-thin gate oxides},
  journal   = {Microelectronics Reliability},
  year      = {2006},
  volume    = {46},
  number    = {9-11},
  pages     = {1603--1607},
  url       = {http://dx.doi.org/10.1016/j.microrel.2006.07.042},
  doi       = {10.1016/j.microrel.2006.07.042},
  timestamp = {Thu, 18 Sep 2014 07:56:36 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/PomplKRK06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}