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@article{DBLP:journals/mr/PolonskyBGWS05,
author = {Stas Polonsky and
M. Bhushan and
A. Gattiker and
Alan J. Weger and
Peilin Song},
title = {Photon emission microscopy of inter/intra chip device performance
variations},
journal = {Microelectronics Reliability},
volume = {45},
number = {9-11},
year = {2005},
pages = {1471-1475},
ee = {http://dx.doi.org/10.1016/j.microrel.2005.07.031},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-03-27 by Michael Ley (ley@uni-trier.de)