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DBLP Record 'journals/mr/PolonskyBGWS05'

BibTeX

@article{DBLP:journals/mr/PolonskyBGWS05,
  author    = {Stas Polonsky and
               M. Bhushan and
               A. Gattiker and
               Alan J. Weger and
               Peilin Song},
  title     = {Photon emission microscopy of inter/intra chip device performance
               variations},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {9-11},
  year      = {2005},
  pages     = {1471-1475},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2005.07.031},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2007-03-27 by Michael Ley (ley@uni-trier.de)