BibTeX record journals/mr/PolingVBJM17

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@article{DBLP:journals/mr/PolingVBJM17,
  author       = {B. S. Poling and
                  Glen David Via and
                  K. D. Bole and
                  E. E. Johnson and
                  J. M. McDermott},
  title        = {Commercial-off-the-shelf algan/gan hemt device reliability study after
                  exposure to heavy ion radiation},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {13--20},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.017},
  doi          = {10.1016/J.MICROREL.2016.09.017},
  timestamp    = {Wed, 01 Jul 2020 09:09:16 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PolingVBJM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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