DBLP BibTeX Record 'journals/mr/PoliakovBPMGVHD12'

  author    = {Pavel Poliakov and
               Pieter Blomme and
               Alessandro Vaglio Pret and
               Miguel Corbalan Miranda and
               Roel Gronheid and
               Diederik Verkest and
               Jan Van Houdt and
               Wim Dehaene},
  title     = {Trades-off between lithography line edge roughness and error-correcting
               codes requirements for NAND Flash memories},
  journal   = {Microelectronics Reliability},
  volume    = {52},
  number    = {3},
  year      = {2012},
  pages     = {525-529},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2011.09.037},
  bibsource = {DBLP, http://dblp.uni-trier.de}