BibTeX record: journals/mr/PoliakovBPMGVHD12

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@article{DBLP:journals/mr/PoliakovBPMGVHD12,
  author    = {Pavel Poliakov and
               Pieter Blomme and
               Alessandro Vaglio Pret and
               Miguel Corbalan Miranda and
               Roel Gronheid and
               Diederik Verkest and
               Jan Van Houdt and
               Wim Dehaene},
  title     = {Trades-off between lithography line edge roughness and error-correcting
               codes requirements for {NAND} Flash memories},
  journal   = {Microelectronics Reliability},
  year      = {2012},
  volume    = {52},
  number    = {3},
  pages     = {525--529},
  url       = {http://dx.doi.org/10.1016/j.microrel.2011.09.037},
  doi       = {10.1016/j.microrel.2011.09.037},
  timestamp = {Thu, 02 Oct 2014 19:02:17 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/PoliakovBPMGVHD12},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}