PhangCOKCPGS03'

@article{DBLP:journals/mr/PhangCOKCPGS03,
  author    = {J. C. H. Phang and
               D. S. H. Chan and
               V. K. S. Ong and
               S. Kolachina and
               J. M. Chin and
               M. Palaniappan and
               G. Gilfeather and
               Y. X. Seah},
  title     = {Single contact beam induced current phenomenon for microelectronic
               failure analysis},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {9-11},
  year      = {2003},
  pages     = {1595-1602},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(03)00280-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}