BibTeX record: journals/mr/PhangCOKCPGS03

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@article{DBLP:journals/mr/PhangCOKCPGS03,
  author    = {J. C. H. Phang and
               D. S. H. Chan and
               V. K. S. Ong and
               S. Kolachina and
               J. M. Chin and
               M. Palaniappan and
               G. Gilfeather and
               Y. X. Seah},
  title     = {Single contact beam induced current phenomenon for microelectronic
               failure analysis},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {9-11},
  pages     = {1595--1602},
  year      = {2003},
  url       = {http://dx.doi.org/10.1016/S0026-2714(03)00280-4},
  doi       = {10.1016/S0026-2714(03)00280-4},
  timestamp = {Sun, 25 Mar 2007 19:35:33 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/PhangCOKCPGS03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}