BibTeX record journals/mr/PetitZ07

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@article{DBLP:journals/mr/PetitZ07,
  author       = {Christian Petit and
                  Damien Zander},
  title        = {Low voltage stress induced leakage current and time to breakdown in
                  ultra-thin (1.2-2.3nm) oxides},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {2-3},
  pages        = {401--408},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.05.006},
  doi          = {10.1016/J.MICROREL.2006.05.006},
  timestamp    = {Fri, 17 Jun 2022 20:50:39 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PetitZ07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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