BibTeX record: journals/mr/PerduDDN10

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@article{DBLP:journals/mr/PerduDDN10,
  author    = {Philippe Perdu and
               Jerome {Di-Battista} and
               Sylvain Dudit and
               Tomonori Nakamura},
  title     = {{VLSI} functional analysis by dynamic emission microscopy.},
  journal   = {Microelectronics Reliability},
  year      = {2010},
  volume    = {50},
  number    = {9-11},
  pages     = {1431--1435},
  url       = {http://dx.doi.org/10.1016/j.microrel.2010.07.077},
  doi       = {10.1016/j.microrel.2010.07.077},
  timestamp = {Wed, 03 Sep 2014 02:18:54 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/PerduDDN10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}