DBLP BibTeX Record 'journals/mr/PerduDDN10'

@article{DBLP:journals/mr/PerduDDN10,
  author    = {Philippe Perdu and
               Jerome Di-Battista and
               Sylvain Dudit and
               Tomonori Nakamura},
  title     = {VLSI functional analysis by dynamic emission microscopy},
  journal   = {Microelectronics Reliability},
  volume    = {50},
  number    = {9-11},
  year      = {2010},
  pages     = {1431-1435},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2010.07.077},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}