BibTeX record journals/mr/ParkFCJLBSBK09

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@article{DBLP:journals/mr/ParkFCJLBSBK09,
  author       = {S. Y. Park and
                  Carlo Floresca and
                  Uttiya Chowdhury and
                  Jose L. Jimenez and
                  Cathy Lee and
                  Edward Beam and
                  Paul Saunier and
                  Tony Balistreri and
                  Moon J. Kim},
  title        = {Physical degradation of GaN {HEMT} devices under high drain bias reliability
                  testing},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {5},
  pages        = {478--483},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.02.015},
  doi          = {10.1016/J.MICROREL.2009.02.015},
  timestamp    = {Sat, 22 Feb 2020 19:27:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ParkFCJLBSBK09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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