DBLP BibTeX Record 'journals/mr/PaganoLPKKYCBS08'

  author    = {R. Pagano and
               Salvatore Lombardo and
               F. Palumbo and
               Paul Kirsch and
               S. A. Krishnan and
               Chadwin D. Young and
               Rino Choi and
               Gennadi Bersuker and
               James H. Stathis},
  title     = {A novel approach to characterization of progressive breakdown
               in high-k/metal gate stacks},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {11-12},
  year      = {2008},
  pages     = {1759-1764},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2008.07.071},
  bibsource = {DBLP, http://dblp.uni-trier.de}