BibTeX record: journals/mr/PaganoLPKKYCBS08

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@article{DBLP:journals/mr/PaganoLPKKYCBS08,
  author    = {R. Pagano and
               Salvatore Lombardo and
               F. Palumbo and
               Paul Kirsch and
               S. A. Krishnan and
               Chadwin D. Young and
               Rino Choi and
               Gennadi Bersuker and
               James H. Stathis},
  title     = {A novel approach to characterization of progressive breakdown in high-k/metal
               gate stacks},
  journal   = {Microelectronics Reliability},
  year      = {2008},
  volume    = {48},
  number    = {11-12},
  pages     = {1759--1764},
  url       = {http://dx.doi.org/10.1016/j.microrel.2008.07.071},
  doi       = {10.1016/j.microrel.2008.07.071},
  timestamp = {Fri, 24 Oct 2014 21:07:07 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/PaganoLPKKYCBS08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}