BibTeX record journals/mr/OualliDPAPGLJTL18

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@article{DBLP:journals/mr/OualliDPAPGLJTL18,
  author       = {Mourad Oualli and
                  Christian Dua and
                  O. Patard and
                  P. Altuntas and
                  S. Piotrowicz and
                  Piero Gamarra and
                  Cedric Lacam and
                  J.{-}C. Jacquet and
                  L. Teisseire and
                  D. Lancereau and
                  Eric Chartier and
                  C. Potier and
                  Sylvain L. Delage},
  title        = {Stability and robustness of InAlGaN/GaN {HEMT} in short-term {DC}
                  tests for different passivation schemes},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {418--422},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.142},
  doi          = {10.1016/J.MICROREL.2018.07.142},
  timestamp    = {Mon, 09 May 2022 18:11:21 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/OualliDPAPGLJTL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}