BibTeX record journals/mr/OederCP17

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@article{DBLP:journals/mr/OederCP17,
  author       = {Thorsten Oeder and
                  Alberto Castellazzi and
                  Martin Pfost},
  title        = {Electrical and thermal failure modes of 600 {V} p-gate GaN HEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {321--326},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.046},
  doi          = {10.1016/J.MICROREL.2017.06.046},
  timestamp    = {Mon, 15 Jun 2020 16:58:29 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/OederCP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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