BibTeX record journals/mr/NeauMVVVBPR07

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@article{DBLP:journals/mr/NeauMVVVBPR07,
  author       = {G. N{\'{e}}au and
                  Fr{\'{e}}d{\'{e}}ric Martinez and
                  M. Valenza and
                  J. C. Vildeuil and
                  E. Vincent and
                  Fr{\'{e}}d{\'{e}}ric Boeuf and
                  F. Payet and
                  K. Rochereau},
  title        = {Impact of strained-channel n-MOSFETs with a SiGe virtual substrate
                  on dielectric interface quality evaluated by low frequency noise measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {567--572},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.079},
  doi          = {10.1016/J.MICROREL.2007.01.079},
  timestamp    = {Tue, 03 Nov 2020 17:24:53 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NeauMVVVBPR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}