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BibTeX record journals/mr/NazarovOLGRS02
@article{DBLP:journals/mr/NazarovOLGRS02, author = {A. N. Nazarov and I. N. Osiyuk and V. S. Lysenko and T. Gebel and Lars Rebohle and W. Skorupa}, title = {Charge trapping and degradation in Ge\({}^{\mbox{+}}\) ion implanted SiO\({}_{\mbox{2}}\) layers during high-field electron injection}, journal = {Microelectron. Reliab.}, volume = {42}, number = {9-11}, pages = {1461--1464}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00170-1}, doi = {10.1016/S0026-2714(02)00170-1}, timestamp = {Thu, 05 Nov 2020 17:00:27 +0100}, biburl = {https://dblp.org/rec/journals/mr/NazarovOLGRS02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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