BibTeX record journals/mr/NazarovOLGRS02

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@article{DBLP:journals/mr/NazarovOLGRS02,
  author       = {A. N. Nazarov and
                  I. N. Osiyuk and
                  V. S. Lysenko and
                  T. Gebel and
                  Lars Rebohle and
                  W. Skorupa},
  title        = {Charge trapping and degradation in Ge\({}^{\mbox{+}}\) ion implanted
                  SiO\({}_{\mbox{2}}\) layers during high-field electron injection},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1461--1464},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00170-1},
  doi          = {10.1016/S0026-2714(02)00170-1},
  timestamp    = {Thu, 05 Nov 2020 17:00:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NazarovOLGRS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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