BibTeX record: journals/mr/MuzykovKZCBAS09

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@article{DBLP:journals/mr/MuzykovKZCBAS09,
  author    = {Peter G. Muzykov and
               Robert M. Kennedy and
               Qingchun Zhang and
               Craig Capell and
               Al Burk and
               Anant Agarwal and
               Tangali S. Sudarshan},
  title     = {Physical phenomena affecting performance and reliability of 4H-SiC
               bipolar junction transistors},
  journal   = {Microelectronics Reliability},
  year      = {2009},
  volume    = {49},
  number    = {1},
  pages     = {32--37},
  url       = {http://dx.doi.org/10.1016/j.microrel.2008.10.009},
  doi       = {10.1016/j.microrel.2008.10.009},
  timestamp = {Tue, 21 Oct 2014 19:35:13 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/MuzykovKZCBAS09},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}