BibTeX record journals/mr/MukhopadhyayLL18

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@article{DBLP:journals/mr/MukhopadhyayLL18,
  author       = {Subhadeep Mukhopadhyay and
                  Yung{-}Huei Lee and
                  Jen{-}Hao Lee},
  title        = {Time-zero-variability and {BTI} impact on advanced FinFET device and
                  circuit reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {81},
  pages        = {226--231},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.12.044},
  doi          = {10.1016/J.MICROREL.2017.12.044},
  timestamp    = {Sat, 22 Feb 2020 19:27:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MukhopadhyayLL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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