BibTeX record journals/mr/MroozKPSVBM01

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@article{DBLP:journals/mr/MroozKPSVBM01,
  author       = {O. Mrooz and
                  A. Kovalski and
                  J. Pogorzelska and
                  O. I. Shpotyuk and
                  M. Vakiv and
                  Bohdan S. Butkiewicz and
                  J. Maciak},
  title        = {Thermoelectrical degradation processes in {NTC} thermistors for in-rush
                  current protection of electronic circuits},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {5},
  pages        = {773--777},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00027-0},
  doi          = {10.1016/S0026-2714(01)00027-0},
  timestamp    = {Mon, 18 May 2020 17:46:09 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MroozKPSVBM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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