BibTeX record journals/mr/MonsieurVRBPG02

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@article{DBLP:journals/mr/MonsieurVRBPG02,
  author       = {Frederic Monsieur and
                  E. Vincent and
                  David Roy and
                  S. Bruy{\`{e}}re and
                  G. Pananakakis and
                  G{\'{e}}rard Ghibaudo},
  title        = {Gate oxide Reliability assessment optimization},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1505--1508},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00179-8},
  doi          = {10.1016/S0026-2714(02)00179-8},
  timestamp    = {Sat, 22 Feb 2020 19:26:48 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MonsieurVRBPG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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