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BibTeX record journals/mr/MonsieurVHBRSPG03
@article{DBLP:journals/mr/MonsieurVHBRSPG03, author = {Frederic Monsieur and E. Vincent and Vincent Huard and S. Bruy{\`{e}}re and David Roy and Thomas Skotnicki and G. Pananakakis and G{\'{e}}rard Ghibaudo}, title = {On the role of holes in oxide breakdown mechanism in inverted nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {43}, number = {8}, pages = {1199--1202}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00172-0}, doi = {10.1016/S0026-2714(03)00172-0}, timestamp = {Mon, 26 Jun 2023 20:52:10 +0200}, biburl = {https://dblp.org/rec/journals/mr/MonsieurVHBRSPG03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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