BibTeX record journals/mr/MonsieurVHBRSPG03

• > Home > journals/mr/MonsieurVHBRSPG03

@article{DBLP:journals/mr/MonsieurVHBRSPG03,
  author       = {Frederic Monsieur and
                  E. Vincent and
                  Vincent Huard and
                  S. Bruy{\`{e}}re and
                  David Roy and
                  Thomas Skotnicki and
                  G. Pananakakis and
                  G{\'{e}}rard Ghibaudo},
  title        = {On the role of holes in oxide breakdown mechanism in inverted nMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1199--1202},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00172-0},
  doi          = {10.1016/S0026-2714(03)00172-0},
  timestamp    = {Mon, 26 Jun 2023 20:52:10 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MonsieurVHBRSPG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}