BibTeX record journals/mr/MoindjieAMGR17

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@article{DBLP:journals/mr/MoindjieAMGR17,
  author       = {Soilihi Moindjie and
                  Jean{-}Luc Autran and
                  Daniela Munteanu and
                  Gilles Gasiot and
                  Philippe Roche},
  title        = {Multi-Poisson process analysis of real-time soft-error rate measurements
                  in bulk 65 nm and 40 nm SRAMs},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {53--57},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.045},
  doi          = {10.1016/J.MICROREL.2017.07.045},
  timestamp    = {Wed, 23 Mar 2022 09:35:32 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MoindjieAMGR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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