BibTeX record journals/mr/MizubayashiYOOHITYHN05

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@article{DBLP:journals/mr/MizubayashiYOOHITYHN05,
  author       = {Wataru Mizubayashi and
                  Naoki Yasuda and
                  Kenji Okada and
                  Hiroyuki Ota and
                  Hirokazu Hisamatsu and
                  Kunihiko Iwamoto and
                  Koji Tominaga and
                  Katsuhiko Yamamoto and
                  Tsuyoshi Horikawa and
                  Toshihide Nabatame},
  title        = {Carrier separation analysis for clarifying carrier conduction and
                  degradation mechanisms in high-k stack gate dielectrics},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {7-8},
  pages        = {1041--1050},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.016},
  doi          = {10.1016/J.MICROREL.2004.12.016},
  timestamp    = {Sat, 22 Feb 2020 19:28:53 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MizubayashiYOOHITYHN05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}