@article{DBLP:journals/mr/MirandaMKI05,
author = {E. Miranda and
J. Molina and
Y. Kim and
H. Iwai},
title = {Degradation of high-K LA$_{\mbox{2}}$O$_{\mbox{3}}$ gate dielectrics
using progressive electrical stress},
journal = {Microelectronics Reliability},
volume = {45},
number = {9-11},
year = {2005},
pages = {1365-1369},
ee = {http://dx.doi.org/10.1016/j.microrel.2005.07.022},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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