BibTeX record journals/mr/MirandaKKSI12

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@article{DBLP:journals/mr/MirandaKKSI12,
  author       = {Enrique Miranda and
                  Takamasa Kawanago and
                  Kuniyuki Kakushima and
                  Jordi Su{\~{n}}{\'{e}} and
                  Hiroshi Iwai},
  title        = {Analysis and modeling of the gate leakage current in advanced nMOSFET
                  devices with severe gate-to-drain dielectric breakdown},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1909--1912},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.012},
  doi          = {10.1016/J.MICROREL.2012.06.012},
  timestamp    = {Sat, 22 Feb 2020 19:29:07 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MirandaKKSI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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