BibTeX record: journals/mr/MeneghiniTSMVMZ07

download as .bib file

@article{DBLP:journals/mr/MeneghiniTSMVMZ07,
  author    = {Matteo Meneghini and
               L. Trevisanello and
               C. Sanna and
               G. Mura and
               Massimo Vanzi and
               Gaudenzio Meneghesso and
               Enrico Zanoni},
  title     = {High temperature electro-optical degradation of InGaN/GaN HBLEDs},
  journal   = {Microelectronics Reliability},
  year      = {2007},
  volume    = {47},
  number    = {9-11},
  pages     = {1625--1629},
  url       = {http://dx.doi.org/10.1016/j.microrel.2007.07.081},
  doi       = {10.1016/j.microrel.2007.07.081},
  timestamp = {Wed, 22 Oct 2014 08:47:49 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/MeneghiniTSMVMZ07},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}