BibTeX record journals/mr/MeneghessoZ02

download as .bib file

@article{DBLP:journals/mr/MeneghessoZ02,
  author       = {Gaudenzio Meneghesso and
                  Enrico Zanoni},
  title        = {Failure modes and mechanisms of InP-based and metamorphic high electron
                  mobility transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {4-5},
  pages        = {685--708},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00045-8},
  doi          = {10.1016/S0026-2714(02)00045-8},
  timestamp    = {Tue, 07 May 2024 20:21:53 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MeneghessoZ02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.