BibTeX record journals/mr/MeneghessoMBRWH16

• > Home > journals/mr/MeneghessoMBRWH16

@article{DBLP:journals/mr/MeneghessoMBRWH16,
  author       = {Gaudenzio Meneghesso and
                  Matteo Meneghini and
                  Davide Bisi and
                  Isabella Rossetto and
                  Tian{-}Li Wu and
                  Marleen Van Hove and
                  Denis Marcon and
                  Steve Stoffels and
                  Stefaan Decoutere and
                  Enrico Zanoni},
  title        = {Trapping and reliability issues in GaN-based {MIS} HEMTs with partially
                  recessed gate},
  journal      = {Microelectron. Reliab.},
  volume       = {58},
  pages        = {151--157},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.024},
  doi          = {10.1016/J.MICROREL.2015.11.024},
  timestamp    = {Tue, 07 May 2024 20:21:53 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MeneghessoMBRWH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}