BibTeX record journals/mr/MelleCMDPBGBVM05

• > Home > journals/mr/MelleCMDPBGBVM05

@article{DBLP:journals/mr/MelleCMDPBGBVM05,
  author       = {S. Mell{\'{e}} and
                  D. De Conto and
                  L. Mazenq and
                  David Dubuc and
                  B. Poussard and
                  C. Bordas and
                  Katja Grenier and
                  Laurent Bary and
                  Olivier Vendier and
                  J. L. Muraro},
  title        = {Failure predictive model of capacitive {RF-MEMS}},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1770--1775},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.092},
  doi          = {10.1016/J.MICROREL.2005.07.092},
  timestamp    = {Sat, 22 Feb 2020 19:28:02 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MelleCMDPBGBVM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}