BibTeX record journals/mr/MedeirosBTVH18

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@article{DBLP:journals/mr/MedeirosBTVH18,
  author       = {G. Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Mottaqiallah Taouil and
                  Fabian Vargas and
                  Said Hamdioui},
  title        = {A defect-oriented test approach using on-Chip current sensors for
                  resistive defects in FinFET SRAMs},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {355--359},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.092},
  doi          = {10.1016/J.MICROREL.2018.07.092},
  timestamp    = {Fri, 03 Sep 2021 09:01:37 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MedeirosBTVH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}