BibTeX record journals/mr/MartinHA03

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@article{DBLP:journals/mr/MartinHA03,
  author       = {Andreas Martin and
                  Jochen von Hagen and
                  Glenn B. Alers},
  title        = {Ramped current stress for fast and reliable wafer level reliability
                  monitoring of thin gate oxide reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1215--1220},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00188-4},
  doi          = {10.1016/S0026-2714(03)00188-4},
  timestamp    = {Thu, 11 Feb 2021 14:51:15 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MartinHA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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