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BibTeX record journals/mr/MaoYWZXT01
@article{DBLP:journals/mr/MaoYWZXT01, author = {Lingfeng Mao and Yao Yang and Jian{-}Lin Wei and Heqiu Zhang and Mingzhen Xu and Changhua Tan}, title = {Effect of SiO\({}_{\mbox{2}}\)/Si interface roughness on gate current}, journal = {Microelectron. Reliab.}, volume = {41}, number = {11}, pages = {1903--1907}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00099-3}, doi = {10.1016/S0026-2714(01)00099-3}, timestamp = {Sat, 22 Feb 2020 19:27:21 +0100}, biburl = {https://dblp.org/rec/journals/mr/MaoYWZXT01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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