BibTeX record: journals/mr/MalbertLCSHJDDDOBBC09

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@article{DBLP:journals/mr/MalbertLCSHJDDDOBBC09,
  author    = {N. Malbert and
               Nathalie Labat and
               A. Curutchet and
               C. Sury and
               V. Hoel and
               J.{-}C. de Jaeger and
               N. Defrance and
               Y. Douvry and
               Christian Dua and
               Mourad Oualli and
               C. Bru{-}Chevallier and
               J.{-}M. Bluet and
               W. Chikhaoui},
  title     = {Characterisation and modelling of parasitic effects and failure mechanisms
               in AlGaN/GaN HEMTs},
  journal   = {Microelectronics Reliability},
  volume    = {49},
  number    = {9-11},
  pages     = {1216--1221},
  year      = {2009},
  url       = {http://dx.doi.org/10.1016/j.microrel.2009.07.015},
  doi       = {10.1016/j.microrel.2009.07.015},
  timestamp = {Thu, 30 Sep 2010 07:30:00 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/MalbertLCSHJDDDOBBC09},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}