BibTeX record: journals/mr/MaigaTTB05

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@article{DBLP:journals/mr/MaigaTTB05,
  author    = {C. O. Ma{\"{\i}}ga and
               Hamid Toutah and
               Boubekeur Tala{-}Ighil and
               B. Boudart},
  title     = {Trench insulated gate bipolar transistors submitted to high temperature
               bias stress},
  journal   = {Microelectronics Reliability},
  year      = {2005},
  volume    = {45},
  number    = {9-11},
  pages     = {1728--1731},
  url       = {http://dx.doi.org/10.1016/j.microrel.2005.07.098},
  doi       = {10.1016/j.microrel.2005.07.098},
  timestamp = {Sun, 26 Oct 2014 09:09:42 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/MaigaTTB05},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}